Integrated Circuit Test Engineering

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Integrated Circuit Test Engineering

Author : Ian A. Grout
ISBN : 1846280230
Genre : Technology & Engineering
File Size : 69.41 MB
Format : PDF, Mobi
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Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Category: Technology & Engineering

Integrated Circuit Test Engineering

Author : Ian A. Grout
ISBN : 1848004095
Genre : Technology & Engineering
File Size : 73.7 MB
Format : PDF, Mobi
Download : 771
Read : 1186

Using the book and the software provided with it, the reader can build his/her own tester arrangement to investigate key aspects of analog-, digital- and mixed system circuits Plan of attack based on traditional testing, circuit design and circuit manufacture allows the reader to appreciate a testing regime from the point of view of all the participating interests Worked examples based on theoretical bookwork, practical experimentation and simulation exercises teach the reader how to test circuits thoroughly and effectively
Category: Technology & Engineering

Digital Integrated Circuits

Author : John E. Ayers
ISBN : 9781439894958
Genre : Technology & Engineering
File Size : 61.66 MB
Format : PDF
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Exponential improvement in functionality and performance of digital integrated circuits has revolutionized the way we live and work. The continued scaling down of MOS transistors has broadened the scope of use for circuit technology to the point that texts on the topic are generally lacking after a few years. The second edition of Digital Integrated Circuits: Analysis and Design focuses on timeless principles with a modern interdisciplinary view that will serve integrated circuits engineers from all disciplines for years to come. Providing a revised instructional reference for engineers involved with Very Large Scale Integrated Circuit design and fabrication, this book delves into the dramatic advances in the field, including new applications and changes in the physics of operation made possible by relentless miniaturization. This book was conceived in the versatile spirit of the field to bridge a void that had existed between books on transistor electronics and those covering VLSI design and fabrication as a separate topic. Like the first edition, this volume is a crucial link for integrated circuit engineers and those studying the field, supplying the cross-disciplinary connections they require for guidance in more advanced work. For pedagogical reasons, the author uses SPICE level 1 computer simulation models but introduces BSIM models that are indispensable for VLSI design. This enables users to develop a strong and intuitive sense of device and circuit design by drawing direct connections between the hand analysis and the SPICE models. With four new chapters, more than 200 new illustrations, numerous worked examples, case studies, and support provided on a dynamic website, this text significantly expands concepts presented in the first edition.
Category: Technology & Engineering

An Introduction To Mixed Signal Ic Test And Measurement

Author : Gordon W. Roberts
ISBN : 0199796211
Genre : Technology & Engineering
File Size : 32.5 MB
Format : PDF
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With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems.
Category: Technology & Engineering

Data Mining And Diagnosing Ic Fails

Author : Leendert M. Huisman
ISBN : 9780387263519
Genre : Technology & Engineering
File Size : 68.90 MB
Format : PDF, ePub
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This book grew out of an attempt to describe a variety of tools that were developed over a period of years in IBM to analyze Integrated Circuit fail data. The selection presented in this book focuses on those tools that have a significant statistical or datamining component. The danger of describing sta tistical analysis methods is the amount of non-trivial mathematics that is involved and that tends to obscure the usually straigthforward analysis ideas. This book is, therefore, divided into two roughly equal parts. The first part contains the description of the various analysis techniques and focuses on ideas and experimental results. The second part contains all the mathematical details that are necessary to prove the validity of the analysis techniques, the existence of solutions to the problems that those techniques engender, and the correctness of several properties that were assumed in the first part. Those who are interested only in using the analysis techniques themselves can skip the second part, but that part is important, if only to understand what is being done.
Category: Technology & Engineering

Rca Engineer

Author :
ISBN : UIUC:30112008087436
Genre : Electronic industries
File Size : 23.86 MB
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Category: Electronic industries

In Circuit Testing

Author : Allen Buckroyd
ISBN : 9781483144498
Genre : Technology & Engineering
File Size : 84.52 MB
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In-Circuit Testing discusses what an in-circuit test (ICT) is and what it can and cannot do. It answers many questions on how tests are actually carried out, with the benefits and drawbacks of the techniques. The emphasis throughout is towards practical problem solving, and many of the examples used are of surface mount printed circuit boards (PCBs). The book contains separate chapters on application—fitting ICT into a typical test strategy and into the manufacturing environment. The buying decision is fully explored—choice of system, initial and ongoing costs, and preparation of the financial proposal to Management. Then, assuming the automatic test equipment (ATE) has been purchased, additional chapters are devoted to: programming problems and solutions, interfacing problems and solutions, fault diagnosis and fault finding tools. Design for in-circuit test also merits a chapter. This covers specific design guides and the constraints which need to be placed on designers to ensure that ICT is cost effective. The concluding chapter reviews the purchase and use of the chosen ICT with the benefit of hindsight; it covers cost effectiveness; looks at alternative methods of testing, programming, and interfacing; and alternative ways of costing the testing service. This book is written for potential purchasers and users of in-circuit automatic testers who are attracted to the concept of ICT, but who may need help. This includes Test Engineering Managers who need guidance on which equipment to buy for a given application (and how to financially justify the purchase), and ATE Programmers, Test Engineers and Technicians who would welcome practical advice on how best to use the chosen ATE.
Category: Technology & Engineering

Journal Of Semicustom Ics

Author :
ISBN : UIUC:30112008151208
Genre : Integrated circuits
File Size : 30.21 MB
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Category: Integrated circuits

Selected Writings

Author : Hope M. Frye
ISBN : STANFORD:36105062039859
Genre : Emigration and immigration law
File Size : 86.35 MB
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Category: Emigration and immigration law

New Scientist

Author :
ISBN : UOM:39015013576940
Genre : Science
File Size : 62.85 MB
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Category: Science

Electronic Design

Author :
ISBN : UCSD:31822004317921
Genre : Electronic apparatus and appliances
File Size : 71.14 MB
Format : PDF, Docs
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Category: Electronic apparatus and appliances

Integrated Circuit Quality And Reliability

Author : Eugene R. Hnatek
ISBN : UOM:39015011996652
Genre : Integrated circuits
File Size : 37.26 MB
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Examines all important aspects of integrated circuit design, fabrication, assembly and test processes as they relate to quality and reliability. This second edition discusses in detail: the latest circuit design technology trends; the sources of error in wafer fabrication and assembly; avenues of contamination; new IC packaging methods; new in-line process monitors and test structures; and more.;This work should be useful to electrical and electronics, quality and reliability, and industrial engineers; computer scientists; integrated circuit manufacturers; and upper-level undergraduate, graduate and continuing-education students in these disciplines.
Category: Integrated circuits

Vlsi Design

Author :
ISBN : UOM:39015010902958
Genre : Computer architecture
File Size : 22.41 MB
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Category: Computer architecture